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SN74ABTH182646APM

Marking:ABTH182646A;Package:LQFP;SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS

MembersoftheTexasInstruments SCOPEEFamilyofTestabilityProducts MembersoftheTexasInstruments WidebusEFamily CompatibleWiththeIEEEStandard 1149.1-1990(JTAG)TestAccessPortand Boundary-ScanArchitecture IncludeD-TypeFlip-FlopsandControl CircuitrytoProvideMultiplex

TI2Texas Instruments

德州儀器美國德州儀器公司

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